2016. Vol.19. No. 1, pp. 14-16
Active Lock-in Thermodynamic Method for Thickness Measurement of Dielectric Coatings
Method. The structure of a noncontact active lock-in thermodynamic system for dielectric coating thickness measurement is offered. The system includes a flashlamp and a thermodynamic sensor with an optical unit. The technique for coating thickness measurement is developed on the base of the offered algorithm for analysis of primary temperature function T(τ), which shows the change of the excess coating surface temperature during heating and cooling.
Results. The main matters of the method metrological provision are justificated including principles of reference stepped thickness standard development; questions of graduation, verification and calibration are considered. It is offered to use basic provisions of the active “National Verification System for Coatings Thickness Measurement Instruments” as well as the technology for metal thickness standard fabrication as most similar.
Discussion. The main technical specifications of the system and examples of its applications in aerospace industry, mechanical engineering, and other industries show the correctness of the main theoretical provisions of the method and long-term benefit of using the system created on its base.
Keywords: infrared thermography, thickness, coating, measurement
1. Bariska A., Reinke N. Einfache Beschichtungskontrolle mit thermischer Schichtprüfung. ITG – Sonderausgabe. 2010, no. 10, pp. 10–13.
2. Vavilov V. P. Infrakrasnaya termografiya i teplovoy kontrol [Infrared Thermography and Thermal Inspection]. Moscow, ID Spektr, 2009, 544 p. (in Russ.).
3. Р 50.2.006-2001. Gosudarstvennaya poverochnaya skhema dlya sredstv izmereniya tolshchiny pokrytiy v diapazone ot 1 do 20000 mkm [National System for Standardization of Measurements. National Verification System for Coatings Thickness Measurement Instruments in the Range 1–20,000 Micrometers]. Moscow, IPK Izdatelstvo standartov, 2001 (in Russ.).
4. Bariska A. Alles unter Kontrolle. — Messen und Prüfen. 2014, v. 64, pp. 30–32.